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artículo con referato
"Cantilever's Behavior in the Ac Mode of an AFM"
V.B. Nunes, S.I. Zanette, A.O. Caride, R. Prioli and A.M.F. Rivas
Material Characterization 50(2-3) (2003) 173-177
In this paper a model with a small number of unknown parameters is used to simulate the motion of a cantilever in the ac mode of an atomic force microscope (AFM). The results allow determining the dependence of the transition from non-contact to tapping operating mode on the height of the contamination layer and on the stiffness of the sample.
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