Página Inicial CNEA Laboratorio TANDAR Página Inicial TANDAR Historia del acelerador TANDAR Web interno Web mail
Inicio » Actividades I+D > Publicaciones 2003 > K X-Ray Production Induced by 12C on Sev...
artículo con referato
"K X-Ray Production Induced by 12C on Several Elements"
M.J. Ozafrán, M.E. Debray, R. Eusebi, A.J. Kreiner, M.E. Vázquez, A. Burlón and P. Stoliar
Nucl. Instrum. Meth. B 201(2) (2003) 317-324
K X-ray production cross sections, photopeak energy shifts and I(Kβ)/I(Kα) intensity ratios are measured for 12C projectiles, in the 14 to 50 MeV bombarding energy range, on several elements (Al, Si, S, Cl, K, Ca, Ti, Cr, Fe, and Cu), using high resolution Si(Li) X-ray spectroscopy. A comparison is made with calculated ECPSSR cross-section values corrected by multiple ionization of K, L and M target subshells and electron capture into the partially empty K-shell of the projectile. The main application for these measurements is multielement trace analysis through PIXE (Particle Induced X-ray Emission).
Av. Gral Paz y Constituyentes, San Martín, Pcia. de Buenos Aires, Argentina
Tel: (54-11) 6772-7007 - Fax: (54-11) 6772-7121